Mueller Matrix Measurement System

High speed and high-precision Mueller matrix measurement system

The 150XT Mueller matrix is a high-speed and high-precision Mueller matrix measurement system developed by the company, which can measure 16 sets of Mueller matrix parameters or complete polarization characteristics of other samples in real time in less than one second. This product developed by Hinds has a wide range of applications in scientific research, industrial measurement, optical component polarization characteristic measurement, manufacturing production/quality inspection, and other fields. The entire system report includes complete software support, which can directly draw linear phase delay, circular polarization delay (or optical rotation), linear dichroism polarization attenuation, and circular dichroism polarization attenuation patterns for various optical, biological, and chemical samples.

Hinds. Mueller Matrix Measurement System, Mueller Matrix Measurement, Exicor，Mueller Polarimeter ，150XT, Mueller ellipsometer

The high-speed and high-precision Mueller matrix measurement system uses modulators and corresponding polarization measurement techniques. The 150XT Mueller matrix ellipsometer can measure 16 sets of Mueller matrix parameters or complete polarization characteristics of other samples in real time in less than one second. The high-speed and high-precision Mueller matrix measurement system developed by Hinds company has a wide range of applications in scientific research, industrial measurement, optical component polarization characteristic measurement, manufacturing production/quality inspection, and other fields. This Mueller matrix measurement system includes complete software support and can directly draw linear phase delay, circular polarization delay (or optical rotation), linear dichroism polarization attenuation, and circular dichroism polarization attenuation patterns for various optical, biological, and chemical samples.

Product Features

♦ Unprecedented Mueller Matrix Detection Accuracy (Full Matrix)

♦ Synchronous measurement of 16 sets of parameters in Mueller matrix

♦ Synchronous measurement of all optical polarization characteristics of the sample

♦ High repeatability accuracy

♦ High speed measurement

♦ Fixed system optical path (no moving components in the optical path, more stable)

♦ Supports measurement scanning for samples of different sizes to be tested

♦ Photoelastic polarization measurement technology

♦ Simple and user-friendly software interface

Product application:

Research and Industrial Development

♦ Quality control/quality inspection measurement

♦ Measurement of the full polarization characteristics of the following samples:

1. Research grade complex internal components

2. Various birefringence/

3. Complex level LCD

4. Homocrystalline crystals

5. Anisotropic crystals

6. Chemical and Biooptical Anisotropic Materials

7. Anisotropic samples caused by magnetic/electric fields

Specifications

mueller matrix(Different parameters result in varying sensitivities)

Approximately 3.533 mm thick C cut quartz plate sample rotated 15 ° along the X-Y axis

（0.5Measurement of raw data using the Mueller matrix with a step size of °

Polarization measurement parameters